2020
DOI: 10.1007/s12274-020-3074-4
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Ultrathin flexible InGaZnO transistor for implementing multiple functions with a very small circuit footprint

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Cited by 9 publications
(11 citation statements)
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“…Owing to the low value of I GS (as shown in Figure S8), the energy consumption caused by the leakage current is neglected here. 12,49,50 The corresponding power consumption values are only 2.16 nW, 3.51 nW, 11.96 nW, 2.83 nW, and 0.019 nW, demonstrating the low-power-consumption photodetectors realized by adopting the fresh and easy-to-handle NW SGT. Figure 3e shows the power consumption of photodetectors working in the unsaturated and saturated regions in the literature.…”
Section: Nano Letters Pubsacsorg/nanolettmentioning
confidence: 99%
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“…Owing to the low value of I GS (as shown in Figure S8), the energy consumption caused by the leakage current is neglected here. 12,49,50 The corresponding power consumption values are only 2.16 nW, 3.51 nW, 11.96 nW, 2.83 nW, and 0.019 nW, demonstrating the low-power-consumption photodetectors realized by adopting the fresh and easy-to-handle NW SGT. Figure 3e shows the power consumption of photodetectors working in the unsaturated and saturated regions in the literature.…”
Section: Nano Letters Pubsacsorg/nanolettmentioning
confidence: 99%
“…Meanwhile, the power consumption is an important parameter of the photodetectors, which can be calculated by eq . Owing to the low value of I GS (as shown in Figure S8), the energy consumption caused by the leakage current is neglected here. ,, The corresponding power consumption values are only 2.16 nW, 3.51 nW, 11.96 nW, 2.83 nW, and 0.019 nW, demonstrating the low-power-consumption photodetectors realized by adopting the fresh and easy-to-handle NW SGT. Figure e shows the power consumption of photodetectors working in the unsaturated and saturated regions in the literature. ,,, , Obviously, the power consumption of the as-constructed SGT photodetector in this work is far below that of the reported photodetectors worked in the saturated region.…”
mentioning
confidence: 99%
“…As described in Fig. 3, compared to the existing memory designs, including memristors, magnetic RAMs, phasechange RAMs, and ferroelectric RAMs [21][22][23][24][25][26][27][28][29] , the proposed onetransistor memory device structure does not involve any capacitors, resistors, or advanced materials. Besides the much simpler structure, the MGT design possesses superior properties of shorter reading and writing time (both ~5 ns), as shown in Supplementary Fig.…”
Section: Memory Implementationmentioning
confidence: 99%
“…However, using the transistor side-gate design does not reduce the device footprint in the circuits, and none of the existing multi-gate designs aimed to reduce the transistor number for circuit simplification. In recent works, we proposed advanced designs to reduce the number of transistors used in a circuit, thereby effectively solving the downsizing problem in modern electronics 3,21,22 . Our previous works reported the simulation result 3 , and the bottom-gate structure of indium gallium zinc oxide transistor was mainly implemented in the lab with limited functions 21,22 .…”
mentioning
confidence: 99%
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