2019
DOI: 10.1016/j.apsusc.2019.02.214
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Ultra-high photoresponse with superiorly sensitive metal-insulator-semiconductor (MIS) structured diodes for UV photodetector application

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Cited by 94 publications
(13 citation statements)
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“…The prepared WO 3 and Sn–WO 3 precursor solutions of 3 mL were deposited separately on the cleaned p-Si substrates (1 cm × 1 cm) by the jet nebulizer spray pyrolysis technique with different concentrations of Sn (0, 4, 8, and 12 wt.%) the copper (Cu) metal contact was coated on the Sn–WO 3 /p-Si using dc sputtering (Model Name: HIND high vacuum-PS 2000) with 4 mm diameter and 500 nm thickness. The instrument details and deposition conditions of the metal contacts were mentioned in their previous work [ 36 , 37 ]. The Sn-WO 3 /p-Si diode showed a positive light response of high reverse saturation current under illumination [ 38 ].…”
Section: Photodetectormentioning
confidence: 99%
“…The prepared WO 3 and Sn–WO 3 precursor solutions of 3 mL were deposited separately on the cleaned p-Si substrates (1 cm × 1 cm) by the jet nebulizer spray pyrolysis technique with different concentrations of Sn (0, 4, 8, and 12 wt.%) the copper (Cu) metal contact was coated on the Sn–WO 3 /p-Si using dc sputtering (Model Name: HIND high vacuum-PS 2000) with 4 mm diameter and 500 nm thickness. The instrument details and deposition conditions of the metal contacts were mentioned in their previous work [ 36 , 37 ]. The Sn-WO 3 /p-Si diode showed a positive light response of high reverse saturation current under illumination [ 38 ].…”
Section: Photodetectormentioning
confidence: 99%
“…It indicates that the surface of the Cu 0.8 Ni 0.2 O film is smoother than that of the CuO film. The smaller surface roughness will generate a homogeneous electric field through the whole device . The average thickness of the Cu 1– x Ni x O films is about 44 nm, which can be observed from SEM images in Figure S4a–c (Supporting Information).…”
Section: Results and Discussionmentioning
confidence: 56%
“…The smaller surface roughness will generate a homogeneous electric field through the whole device. 16 The To further explore the device performance, CuO film photodetectors were fabricated. Figure 2a shows the room temperature current−voltage curves of the CuO photodetector under laser illumination.…”
Section: Resultsmentioning
confidence: 99%
“…x = 0.4 concentration revealed a high detectivity of D* = 0.5059 10 12 Jones, which is comparatively higher than by Su and Ouyang et al [64][65][66][67][68][69][70][71][72][73][74][75] The obtained higher detectivity suggests a low noise level of the fabricated MOS diodes. The fabricated MOS diode with superior detectivity (i.e.…”
Section: Qe ¼ (7) Qlmentioning
confidence: 58%