2021 IEEE 48th Photovoltaic Specialists Conference (PVSC) 2021
DOI: 10.1109/pvsc43889.2021.9518997
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Transient Metastable Behaviour in Highly Efficient MZO/CdSeTe/CdTe Thin Film Solar Cells

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Cited by 3 publications
(5 citation statements)
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“…We have previously reported on the behavior of MZO/ CdSeTe/CdTe devices with 11 wt% of MgO content in the MZO layer [4]. Here, we report on the metastable behavior of PV parameters observed in devices with MgO content of 5 wt%, 8 wt%, 11 wt%, 14 wt%, and 21 wt% as measured in different laboratories under different ambient conditions.…”
mentioning
confidence: 82%
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“…We have previously reported on the behavior of MZO/ CdSeTe/CdTe devices with 11 wt% of MgO content in the MZO layer [4]. Here, we report on the metastable behavior of PV parameters observed in devices with MgO content of 5 wt%, 8 wt%, 11 wt%, 14 wt%, and 21 wt% as measured in different laboratories under different ambient conditions.…”
mentioning
confidence: 82%
“…However, modifying the cell architecture introduces more complexity in understanding the factors that limit performance and has also introduced detrimental characteristics in the PV device, including stability issues as well as transient metastable behavior due to prior exposure history (such as temperature, climate, and irradiance). These characteristics have been observed after introducing the MZO buffer layer [4]. Furthermore, for consistent comparisons between different laboratories when using different PV materials and architectures, it is advisable to adopt a common preconditioning procedure in order to measure and interpret reliable performance data.…”
mentioning
confidence: 95%
“…Others have noted that the S-kink in the MZO devices can also be due to metastability in the MZO due to the formation of MgO during processing. 27,28 Thus, both mechanisms depend on device processing, especially when CdCl 2 activation is done in air. We note that the devices reported here were CdCl 2 activated in air and illuminated with an LED solar simulator with a 400 nm low wavelength cutoff but do not show any S-kink-like behavior until the bandgap of the emitter is 4.10 eV.…”
Section: Ga O Gmentioning
confidence: 99%
“…For some devices, the S-kink appears to be related to the carrier concentration and Fermi level position in the MZO even when only a small positive CBO exists , when the doping level in MZO is controlled by oxygen vacancy concentration. Others have noted that the S-kink in the MZO devices can also be due to metastability in the MZO due to the formation of MgO during processing. , Thus, both mechanisms depend on device processing, especially when CdCl 2 activation is done in air. We note that the devices reported here were CdCl 2 activated in air and illuminated with an LED solar simulator with a 400 nm low wavelength cutoff but do not show any S-kink-like behavior until the bandgap of the emitter is 4.10 eV.…”
mentioning
confidence: 99%
“…The measurement follows 3 important steps; the contact check, the sheet resistance measurement, and the Hall resistance measurement in order to extract reliable and accurate carrier concentration and mobility. The details of the measurements steps have been provided elsewhere [10].…”
Section: B Pdl Hall Effect Measurementsmentioning
confidence: 99%