Perovskite solar cell device performance
is affected by optical
and electronic losses. To minimize these losses in solar cells, it
is important to identify their sources. Here, we report the optical
and electronic losses arising from physically mixed interfacial layers
between the adjacent component materials in highly efficient two terminal
(2T) all-perovskite tandem, single-junction wide-bandgap, and single-junction
narrow-bandgap perovskite-based solar cells. Physically mixed interfacial
layers as the sources of optical and electronic losses are identified
from spectroscopic ellipsometry measurements and data analysis followed
by comparisons of simulated and measured external quantum efficiency
spectra. Parasitic absorbance in the physically mixed regions between
silver metal electrical contacts and electron transport layers (ETLs)
near the back contact and a physical mixture of commercial indium
tin oxide and hole transport layers (HTL) near the front electrical
contact lead to substantial optical loss. A lower-density void + perovskite
nucleation layer formed during perovskite deposition at the interface
between the perovskite absorber layer and the HTL causes electronic
losses because of incomplete collection of photogenerated carriers
likely originating from poor coverage and passivation of the initially
nucleating grains.
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