2006
DOI: 10.1109/tns.2006.885384
|View full text |Cite
|
Sign up to set email alerts
|

Transient Currents Generated by Heavy Ions With Hundreds of MeV

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
18
0

Year Published

2007
2007
2014
2014

Publication Types

Select...
8

Relationship

2
6

Authors

Journals

citations
Cited by 16 publications
(19 citation statements)
references
References 19 publications
1
18
0
Order By: Relevance
“…3(c) represents the transient currents at the center on a log scale. The carrier dynamics after an ion strike has been studied by Technology Computer Aided Design for the same DUTs used in the previous works [7,10]. The dynamics can be simplified into the ambipolar, the bipolar and the diffusion phases.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…3(c) represents the transient currents at the center on a log scale. The carrier dynamics after an ion strike has been studied by Technology Computer Aided Design for the same DUTs used in the previous works [7,10]. The dynamics can be simplified into the ambipolar, the bipolar and the diffusion phases.…”
Section: Resultsmentioning
confidence: 99%
“…However the available energy range of microbeams at present systems is much lower than that of a Galactic Cosmic Ray (GCR) because it is well known that a GCR consists of a lot of heavy ions, which energy reaches hundreds of GeV/amu with a peak flux at a few hundred MeV/amu [5]. We have reported the TIBIC image observed by using the high-energy collimated 150 MeV Argon (Ar) beam from the AVF Cyclotron [10]. The major drawback of this system is the beam size resulting in the poor resolution of more than 5 lm.…”
Section: Introductionmentioning
confidence: 99%
“…Note the -phase gradient also decreases with increasing injection. The data clearly illustrates that track structure can lead to differing pulse shapes for certain device structure/plasma configurations [3], [20]. For the defocused case with a track width similar to junction diameter, the transient current is larger and faster, illustrating minimal screening compared to the focused case.…”
Section: B the Case For A Si Photodetectormentioning
confidence: 92%
“…It is well known that the initial track structure strongly affects the carrier dynamics in devices and, thus, the shape of transient current waveform [38], [39]. The distributions of e-h pairs could be calculated by the method developed by Kobetich and Katz (KK) [40].…”
Section: Ion Track Structures In Sic and Simentioning
confidence: 99%