2001
DOI: 10.1002/1521-396x(200111)188:1<467::aid-pssa467>3.3.co;2-t
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Thermal Stability of MOCVD and HVPE GaN Layers in H2, HCl, NH3 and N2

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Cited by 7 publications
(9 citation statements)
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“…It has been reported that H 2 enhances GaN decomposition; H and N atoms combine to form NH 3 [9][10][11][12][13]. As H mostly reacts with N, we presume that during H 2 etching, a facet formed with N atoms (N-terminated) will be unstable whereas a facet formed with Ga atoms (Ga-terminated) will be stable.…”
Section: Resultsmentioning
confidence: 86%
“…It has been reported that H 2 enhances GaN decomposition; H and N atoms combine to form NH 3 [9][10][11][12][13]. As H mostly reacts with N, we presume that during H 2 etching, a facet formed with N atoms (N-terminated) will be unstable whereas a facet formed with Ga atoms (Ga-terminated) will be stable.…”
Section: Resultsmentioning
confidence: 86%
“…[11]. Henceforth, the annealed samples will be referred to only by their polarity and not the particular growth technique for clarity.…”
Section: Methodsmentioning
confidence: 99%
“…This group previously reported a comparative thermal stability study of MOVPE versus HVPE GaN films [11]. The observed difference in stability is accounted for by the difference in polarity of films and not the particular growth technique.…”
Section: Introductionmentioning
confidence: 99%
“…This is an investigation of the morphology of GaN etched in hydrogen (H 2 ) at high temperature. The body of literature comprises of studies on GaN decomposition in H 2 to understand the influence of H 2 during GaN growth [8][9][10]; surface morphology has not been investigated in detail. In order to examine the morphology, GaN has been etched in this study, where several profiles show the potential of H 2 etching for pattern producing.…”
Section: Introductionmentioning
confidence: 99%