“…(11) differs from that of anN-stage ideal delay, given by z-N, due to the term 'I)N(1 -E Z-1 rN which is responsible for attenuation and distortion. This distortion causes a train of spurious pulses in the unit sample response of the device.…”
Section: Characterization Measurement and Compensation Of Charge-tramentioning
confidence: 99%
“…(c) Fringing field drift,}t = q p (x,t) p. 11 Et (x,t) (4) where q is the electronic charge, p is the number of charge carriers per unit volume, E is the electric field, j is the current density, D is the diffusion co-efficient and p. is the carrier mobility.…”
Section: Physics Of Charge-coupled Devicesmentioning
confidence: 99%
“…Since the surface potential under G 2 , simulating the MOST drain is a function of charge, the MOST may be characterised by a drain with time-varying drain voltage. Amount of charge below G 2 , in this scheme, is given by, 11 Q,,g = I I dt (7) 11 The operating conditions are such that I is saturated making it time independent.…”
Section: The Input and Output Schemes Input Circuitmentioning
confidence: 99%
“…This has led to the development of all solid-state TV cameras and facsimile systems (Tompsett et al 1973, Tompsett et al 1971). Due to their low inherent noise characteristics, they are sensitive even at extremely low-light levels.…”
“…(11) differs from that of anN-stage ideal delay, given by z-N, due to the term 'I)N(1 -E Z-1 rN which is responsible for attenuation and distortion. This distortion causes a train of spurious pulses in the unit sample response of the device.…”
Section: Characterization Measurement and Compensation Of Charge-tramentioning
confidence: 99%
“…(c) Fringing field drift,}t = q p (x,t) p. 11 Et (x,t) (4) where q is the electronic charge, p is the number of charge carriers per unit volume, E is the electric field, j is the current density, D is the diffusion co-efficient and p. is the carrier mobility.…”
Section: Physics Of Charge-coupled Devicesmentioning
confidence: 99%
“…Since the surface potential under G 2 , simulating the MOST drain is a function of charge, the MOST may be characterised by a drain with time-varying drain voltage. Amount of charge below G 2 , in this scheme, is given by, 11 Q,,g = I I dt (7) 11 The operating conditions are such that I is saturated making it time independent.…”
Section: The Input and Output Schemes Input Circuitmentioning
confidence: 99%
“…This has led to the development of all solid-state TV cameras and facsimile systems (Tompsett et al 1973, Tompsett et al 1971). Due to their low inherent noise characteristics, they are sensitive even at extremely low-light levels.…”
“…The major source of transfer inefficiency then comes from interface states at the edges of the transfer electrodes. This occurs because the area of interface over which a charge packet is stored is larger than that occupied by background charge [23]. This is sometimes referred to as the non-linear i-ss since the loss is a function of signal size [24].…”
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