1973
DOI: 10.1109/t-ed.1973.17607
|View full text |Cite
|
Sign up to set email alerts
|

The quantitative effects of interface states on the performance of charge-coupled devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
18
0

Year Published

1973
1973
1999
1999

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 93 publications
(18 citation statements)
references
References 12 publications
0
18
0
Order By: Relevance
“…(11) differs from that of anN-stage ideal delay, given by z-N, due to the term 'I)N(1 -E Z-1 rN which is responsible for attenuation and distortion. This distortion causes a train of spurious pulses in the unit sample response of the device.…”
Section: Characterization Measurement and Compensation Of Charge-tramentioning
confidence: 99%
See 3 more Smart Citations
“…(11) differs from that of anN-stage ideal delay, given by z-N, due to the term 'I)N(1 -E Z-1 rN which is responsible for attenuation and distortion. This distortion causes a train of spurious pulses in the unit sample response of the device.…”
Section: Characterization Measurement and Compensation Of Charge-tramentioning
confidence: 99%
“…(c) Fringing field drift,}t = q p (x,t) p. 11 Et (x,t) (4) where q is the electronic charge, p is the number of charge carriers per unit volume, E is the electric field, j is the current density, D is the diffusion co-efficient and p. is the carrier mobility.…”
Section: Physics Of Charge-coupled Devicesmentioning
confidence: 99%
See 2 more Smart Citations
“…The major source of transfer inefficiency then comes from interface states at the edges of the transfer electrodes. This occurs because the area of interface over which a charge packet is stored is larger than that occupied by background charge [23]. This is sometimes referred to as the non-linear i-ss since the loss is a function of signal size [24].…”
Section: Problem Identificationmentioning
confidence: 99%