The orientation dependence of the deposition of
InAsxPfalse(1−xfalse)
epitaxial layers on
normalGaAs
using an
AsH3
,
PH3
, indium, and
normalHCl
vapor‐deposition system was studied. The total flow rate and the ratio of Group III to total Group V components were held constant while deposits were made simultaneously on (100), (110), (111)A and (111) substrates. Similar deposits were made under the same conditions on spherical, single‐crystal
normalGaAs
substrates. Growth on these spheres exhibited facets that correspond to slow growth and high‐perfection orientations. The sphere surface morphologies were similar to the planar substrates over much of the composition range.