1993
DOI: 10.1149/1.2221118
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The Influence of Lithographic Patterning on Current Distribution in Electrodeposition: Experimental Study and Mass‐Transfer Effects

Abstract: The effect of lithographic patterning on electrodeposit thickness uniformity was investigated in a series of experiments. Copper was electrodeposited from an acid‐sulfate solution onto a specially patterned cathode under controlled agitation provided by a reciprocating paddle. The thickness nonuniformity resulting from a difference in “active‐area‐density” between adjacent zones was measured by profilometry. At current densities far below the mass‐transfer limit, the thickness distributions agreed well with pr… Show more

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Cited by 61 publications
(34 citation statements)
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“…In order to improve and control the vertical anisotropy in the magnet arrays effectively as well as to reduce surface irregularity of electroplated materials, both ceramic magnets (Ferrimag 8A, Adams Magnetic Products, 3900 G) and a paddle agitator [10] were used to build the electroplating system as shown in Fig. 4.…”
Section: A Electroplating Of Permanent Magnetsmentioning
confidence: 99%
“…In order to improve and control the vertical anisotropy in the magnet arrays effectively as well as to reduce surface irregularity of electroplated materials, both ceramic magnets (Ferrimag 8A, Adams Magnetic Products, 3900 G) and a paddle agitator [10] were used to build the electroplating system as shown in Fig. 4.…”
Section: A Electroplating Of Permanent Magnetsmentioning
confidence: 99%
“…The auxiliary electrode is used here to tamper the edge and corner effect, 19 so that practically any remaining non-uniformity could be attributed to non-uniform active area density. Similar method was employed by Mehdizadeh et al 7 The AADR and AAD of the upper and lower half of the pattern is the same, but the width of the lines in the lower half region is double that of the upper region so that the effect of line width can also be studied.…”
Section: Methodsmentioning
confidence: 99%
“…Wafer-to-wafer repeatability is very important in order to ensure uniform product characteristics, and within-die or within-feature thickness or alloy composition uniformity may also be critical factors. Some of these considerations mean that the microscale pattern density of the substrate may be important in terms of determining the results on the wafer or substrate [37][38][39].…”
Section: Wafer Plating Equipmentmentioning
confidence: 99%