2015
DOI: 10.1016/j.egypro.2015.07.103
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The Influence of ITO Dopant Density on J-V Characteristics of Silicon Heterojunction Solar Cells: Experiments and Simulations

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Cited by 41 publications
(23 citation statements)
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“…These seemingly competing requirements have both implications toward the FF of high-efficiency SHJ devices. However, the FF loss observed for lowly doped TCO-contact films [4], [46], [47] cannot be explained by their higher WF, which instead should mitigate possible detrimental "Schottkycontact" effects [39], [42].…”
Section: A Transport and Recombination At The Hole Contactmentioning
confidence: 99%
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“…These seemingly competing requirements have both implications toward the FF of high-efficiency SHJ devices. However, the FF loss observed for lowly doped TCO-contact films [4], [46], [47] cannot be explained by their higher WF, which instead should mitigate possible detrimental "Schottkycontact" effects [39], [42].…”
Section: A Transport and Recombination At The Hole Contactmentioning
confidence: 99%
“…This way, the impact of the TCO quality as contact layer on FF can be assessed, independent of its lateral conductivity properties. For this configuration, experimental results [4], [46], [47] indicate that for high FFs (and high n 100 [4]), sufficiently conductive TCO films are needed to contact the a-Si:H(p) layer. Such high TCO conductivities are needed for low contact resistivities.…”
Section: A Transport and Recombination At The Hole Contactmentioning
confidence: 99%
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“…It is also important to note that a computational issue associated with using low doped layers in the ITO(n + )/a-Si:H(p) junction is that the non-local band to band tunneling model being used suffers from convergence issues when the layers are completely depleted. Previous simulation studies conducted by Kanevce et al [44,18] and Kirner et al [52] showed the importance of the tunneling mechanism at the ITO(n + )/a-Si:H(p) junction. Thus, we arrive at the conclusion that; 1) a high workfunction achieved by low doping in the ITO(n + ) layer will lead to reduced tunneling at the ITO(n + )/a-Si:H(p) interface which will result in an increased ρc, and 2) a low workfunction achieved by high doping in the ITO(n + ) layer will lead to increased tunneling current and thus a lower ρc .…”
Section: Variation Of Ito Dopingmentioning
confidence: 98%
“…However, ITO does not come without shortcomings: high performance films require high deposition vacuum (although compatible with the sol-gel method [7], this yields more resistive coatings ∼ 10 3 Ω/sq), ITO also requires high deposition or annealing temperature [8], it is brittle by nature and the limited global supply has begun to drive research into alternative TCFs [1]. Thin films of ITO must be processed carefully and methodically in order to achieve reproducible performance which varies with doping concentration [9], crystal orientation, and surface roughness. Consequently, ITO is a challenging candidate for transparent electrodes in touch screens and flexible electronics.…”
Section: Transparent and Conductive Electrodes By Large-scale Nano-stmentioning
confidence: 99%