2016
DOI: 10.1109/jphotov.2015.2484962
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Transparent Electrodes in Silicon Heterojunction Solar Cells: Influence on Contact Passivation

Abstract: Abstract-Charge carrier collection in silicon heterojunction solar cells occurs via intrinsic/doped hydrogenated amorphous silicon layer stacks deposited on the crystalline silicon wafer surfaces. Usually, both the electron and hole collecting stacks are externally capped by an n-type transparent conductive oxide, which is primarily needed for carrier extraction. Earlier, it has been demonstrated that the mere presence of such oxides can affect the carrier recombination in the crystalline silicon absorber. Her… Show more

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Cited by 41 publications
(26 citation statements)
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“…266 While such transparent conductive oxides clearly lead to an increase in the current density, the use of hydrogenated amorphous silicon oxide or silicon carbide often results in a reduced fill factor, and neutralizes the gains in short-circuit current. In general, fill factor losses related to transparent conductive oxides are due to a suboptimally matched work function, 267,268 or to increased sheet or contact resistances between the transparent conductive oxide and the doped amorphous silicon layers. 269 Transparent conductive oxides typically exhibit n-type conductivity and consequently readily form an Ohmic contact to n-type hydrogenated amorphous silicon.…”
Section: Reviewmentioning
confidence: 99%
“…266 While such transparent conductive oxides clearly lead to an increase in the current density, the use of hydrogenated amorphous silicon oxide or silicon carbide often results in a reduced fill factor, and neutralizes the gains in short-circuit current. In general, fill factor losses related to transparent conductive oxides are due to a suboptimally matched work function, 267,268 or to increased sheet or contact resistances between the transparent conductive oxide and the doped amorphous silicon layers. 269 Transparent conductive oxides typically exhibit n-type conductivity and consequently readily form an Ohmic contact to n-type hydrogenated amorphous silicon.…”
Section: Reviewmentioning
confidence: 99%
“…Consequently, the low doping efficiency of boron in a-Si:H can lead to inadequate band bending at the c-Si surface, and so FF issues attributed to injection-dependent recombination at the hole contact. 78,79 The most commonly ascribed shortcoming of the SHJ approach in terms of its ultimate performance is the parasitic absorption occurring in the front a-Si:H layers and TCO (typically ITO) that provides lateral charge transport. 80 Recent PCE improvements have consequently come from implementing the more complex IBC design, which places both contacts on the rear side of the cell, removing both the TCO and doped a-Si:H from the sun-facing side of the device.…”
Section: Mis Passivating Contactsmentioning
confidence: 99%
“…For a stack of sufficiently thin layers, the resulting c-Si surface potential can be affected by the presence of overlying films that are not directly in contact with the c-Si surface. Even the uppermost film in thin three-layer stacks, such as the TCO film in SHJ contacts, may influence the underlying c-Si surface potential 49,50 . Consequently, to guarantee high electron selectivity, the Si:H(n) layer of the interband-tunnelling contact must be engineered to induce, but also to shield the c-Si surface potential from the presence of the Si:H(p) overlayer.…”
Section: Requirements For E Cient Tunnel-ibc Solar Cellsmentioning
confidence: 99%