1997
DOI: 10.1016/s0257-8972(97)00029-7
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The industrial establishment of a new highly productive deposition technique for reflection increasing layer systems

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Cited by 5 publications
(2 citation statements)
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“…Specifically, the optical thickness that leads to minimum reflectance and minimum reflectance change are completely different in each wavelength region. 7,9 From this simulation, we found that Ag with the overcoating of one pair of low refractive index layer and high refractive index layer consisting of Ag/ SiO 2 ͑54 nm͒ / TiO 2 ͑55 nm͒ would reach the maximum R vis of 99.3%, and we decided to apply it and make that multilayer high reflectance coating by sputtering. III B 3 in detail later.…”
Section: Optical Simulation Of Reflection Spectramentioning
confidence: 98%
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“…Specifically, the optical thickness that leads to minimum reflectance and minimum reflectance change are completely different in each wavelength region. 7,9 From this simulation, we found that Ag with the overcoating of one pair of low refractive index layer and high refractive index layer consisting of Ag/ SiO 2 ͑54 nm͒ / TiO 2 ͑55 nm͒ would reach the maximum R vis of 99.3%, and we decided to apply it and make that multilayer high reflectance coating by sputtering. III B 3 in detail later.…”
Section: Optical Simulation Of Reflection Spectramentioning
confidence: 98%
“…1 Ag coating on polyethylene telephthalate ͑PET͒ film has been studied. [5][6][7] Park 8 reported an appropriate thickness of the layer next to the metal layer in 1964. 4 A multilayer high reflectance coating consisting of Al and ͓a low refractive index layer ͑quarter wave thickness͒ and a high refractive index layer ͑quarter-wave thickness͔͒ has been investigated for outer space applications since the 1950s.…”
Section: Introductionmentioning
confidence: 99%