The effect of relative humidity on friction and pull-off forces measured on submicron-size asperity arrays

Ando, Yasuhisa

doi:10.1016/s0043-1648(99)00334-8

Cited by 106 publications

(60 citation statements)

References 15 publications

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“…Then indeed a distribution with two peaks was observed (Fig.4.15), one with low adhesion forces caused by interaction with the silicon wafer, another at higher forces caused by the interaction with TiO 2 . This results agree with results of Ando on roughness surface [183]. The mean value of adhesion force between silicon tip and TiO 2 was two times the adhesion force between silicon tip and silicon wafer.…”

Section: Resultssupporting

confidence: 92%

“…This is with AFM [69,119,[190][191][192][193][194][195][196][197][198]. Many experiments showed a significant dependency of the adhesion force on the relative humidity [40,52,54,56,57,183]. A continuous increase humidity was, for example, observed for the interaction of a silicon nitride tip with mica [194], between silica particles [199], a silica particle and a silicon wafer [200], or between a silicon nitride tip and molybdenum trioxide [201].…”

Section: Influence Of Humidity On Adhesionmentioning

confidence: 91%

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On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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Section: Resultssupporting

confidence: 92%

Section: Influence Of Humidity On Adhesionmentioning

confidence: 91%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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“…They observed good agreement with this model when looking at the increase in angle of repose of model substances with time and humidity. An analogous experiment on the nanoscale was done by Ando [690]. They used microfabricated silicon arrays of asperities and AFM silicon probes with a flat of 0.7 mm Â 0.7 mm at the end.…”

Section: Meniscus Forcementioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,193

2,949

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“…Literature indicates that at 20°C and 35%RH, when the load is varied between 20 nN and 250 nN, there is no significant change in the adhesion force [9].…”

Section: Atomic Force Microscopymentioning

confidence: 99%

Humidity influence on the adhesion of SU-8 polymer from MEMS applications

et al. 2017

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Abstract. In this paper, the adhesion behaviors of SU-8 polymer thin film from MEMS application were investigated as a function of relative humidity. The adhesion test between the AFM tip and SU-8 polymer have been extensively studied using the atomic force microscope (AFM), for a relative humidity (RH) varying between 20 and 90%. The samples for tests are SU-8 polymers hard baked at different temperatures. The hard bake temperature changes the tribo-mechanical properties of polymers. The paper reports the measurements and the modeling of adhesion forces versus humidity in controlled ranges between 20 to 90%RH. To investigate the effect of relative humidity on adhesion for SU-8 polymer hard baked we used an analytical method which encompasses the effect of capillarity as well as the solid-to-solid interaction. While the capillary force expression is considered to be the sum of the superficial tension and the Laplace force for the solid-solid interaction is expressed by the Derjagin, Muller and Toropov (DMT) model of solids adhesion. The analytical results obtained are in accordance with those obtained experimentally.

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The effect of relative humidity on friction and pull-off forces measured on submicron-size asperity arrays

Cited by 106 publications

References 15 publications

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

Force measurements with the atomic force microscope: Technique, interpretation and applications

Humidity influence on the adhesion of SU-8 polymer from MEMS applications

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