“…It has been established that the relationship between drift resistance and time can be CrystEngComm Paper expressed as R t = R (t/t 0 ) γ , where R t is the resistance measured at time t, t 0 is the initial state of the material, R 0 is a constant describing the material's order-of-magnitude, and γ is the exponent of the power law relationship of the resistance drifts with time. 28 As shown in Fig. 5, the resistance drift curves for the Ge 1 Sb 9 , Y 0.13 (Ge 1 Sb 9 ) 0.87 and Y 0.26 (Ge 1 Sb 9 ) 0.74 thin films were measured at 85 °C.…”