2006
DOI: 10.1016/j.jnoncrysol.2005.10.025
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Texture and surface analysis of thin-film GaAs on glass formed by pulsed-laser deposition

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Cited by 12 publications
(6 citation statements)
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References 12 publications
(15 reference statements)
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“…On the other hand, AFM images may not have the capability to reveal crystalline film substructures, which may cause the discrepancy found. We observed a similar difference in grain size as determined from x-ray data and AFM for low-temperature PLD GaAs on glass as well [25].…”
supporting
confidence: 77%
“…On the other hand, AFM images may not have the capability to reveal crystalline film substructures, which may cause the discrepancy found. We observed a similar difference in grain size as determined from x-ray data and AFM for low-temperature PLD GaAs on glass as well [25].…”
supporting
confidence: 77%
“…The measurement has been carried out at room temperature in Van der Pauw geometry with In contacts employing a magnetic field of 1.5 T. The result reveals that the deposited GaAs film is indeed p-type but with extremely low acceptor concentration and mobility, approximately 10 13 cm −3 and 6 cm 2 V −1 s −1 , respectively. The low mobility, which is well below the GaAs bulk value of 400 cm 2 V −1 s −1 for holes, explains the intrinsic serial load of the samples revealed in figure 1 and confirms our conclusions in [11] that PLD GaAs is of multi-phase nature including crystalline but also amorphous parts, which hamper carrier transport.…”
supporting
confidence: 87%
“…Still it is not completely clear whether this is a result of material transport directly from the target instead of deposition from plasma or it can be ascribed to some irregularities in the deposition from the plasma itself, but this has been noted also before [12]. Nevertheless, the size of these agglomerates is typically above a few m and therefore they could not be detected in our selected GISAXS range.…”
Section: Resultsmentioning
confidence: 88%