2010
DOI: 10.1007/978-1-4419-7618-5_3
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Testing 3D Stacked ICs Containing Through-Silicon Vias

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Cited by 3 publications
(2 citation statements)
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“…Malicious software executed on the 3D-MPSoC can exploit this natural phenomenon to manipulate the data on some TSV wires. The attacks can be in the form of i) modifying data on the victim-TSV through the coupling effect of adjacent aggressor TSVs [122], ii) reduce the lifetime of the victim TSV by increasing the chance of stress cracks [123], [124] or through electromigration effects [23], and iii) corrupting transmissions by delaying or speeding up signal transitions [123].…”
Section: D Nocs Countermeasuresmentioning
confidence: 99%
“…Malicious software executed on the 3D-MPSoC can exploit this natural phenomenon to manipulate the data on some TSV wires. The attacks can be in the form of i) modifying data on the victim-TSV through the coupling effect of adjacent aggressor TSVs [122], ii) reduce the lifetime of the victim TSV by increasing the chance of stress cracks [123], [124] or through electromigration effects [23], and iii) corrupting transmissions by delaying or speeding up signal transitions [123].…”
Section: D Nocs Countermeasuresmentioning
confidence: 99%
“…Moreover, the semiconductor industry is continuously demanding more functionality, bandwidth, and performance at smaller sizes, power dissipation, and cost. Thus, TSV-based 3D-SICs are the promising solution for such requirements [3]. 3D-SICs is a continuation of Moore's Law, which is called more than Moore's law.…”
Section: Introductionmentioning
confidence: 99%