Electro-optic transceivers integrated in silicon-photonics interposers are attractive for realizing low-power high-bandwidth Optical I/O for future advanced logic and memory. We review recent results obtained at imec on low-voltage silicon ring modulators and Ge photodetectors. Obtaining such power efficiencies and bandwidth densities within the voltage constraints of advanced CMOS circuits will require the adoption of the best-in-class silicon optical devices, combining low-loss optical channels with high modulation and photodetection efficiencies at low applied voltages. Although monolithic integration of photonics into the CMOS flow would arguably enable the highest integration density and best power efficiencies, co-integration of high-performance silicon optical devices becomes increasingly more challenging in advanced CMOS nodes, and it is not clear if sufficient compound yield can be obtained at low cost. An attractive alternative for silicon-based Optical I/O involves the 3-D flip-chip assembly through microbumping [2] of a silicon-photonics interposer with the CMOS logic die and/or DRAM stack, as shown in Fig. 1. Microbumping enables tight, hybrid integration of know-good dies fabricated with distinct optimized technologies within a single package, with low electrical parasitics. The potential of tight-pitch microbumping for realizing silicon optical transceivers with sub-pJ/bit energy efficiency using has already been demonstrated in [3]. In this paper, we review the recent progress at imec on low-voltage, low-loss silicon ring modulators and Ge waveguide photodetectors and their co-integration on a silicon-on-insulator wafer for realizing a high-performance silicon-photonics interposer, as a first step to toward a competitive 3-D Optical I/O technology.
Low-loss, low-voltage silicon electro-optic ring modulatorsSilicon ring optical modulators are attracting increasing interest for low energy, small footprint optical interconnects co-integrated with CMOS electronics. Key requirements for such devices are high extinction ratio (ER~10dB), low insertion loss (IL<1dB), high modulation speed (>10Gb/s) and low energy per bit (<50fJ/bit). Recently, 10 Gb/s and 25 Gb/s optical modulation has been reported in carrier-depletion ring modulators using a 1 V peak-to-peak driving voltage (V pp ) [4]. However, the obtained extinction ratios were limited to 5dB for insertion losses lower than 3dB. Such modulators are typically designed with the depletion area parallel to the waveguide (lateral diode design). Modulators with junctions perpendicular to the waveguide (interdigitated diode design) have been proposed to