2013
DOI: 10.1016/j.sna.2013.05.027
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Temperature dependent current-transport mechanism in Au/(Zn-doped)PVA/n-GaAs Schottky barrier diodes (SBDs)

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Cited by 78 publications
(53 citation statements)
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“…The observed increase in barrier height with increase in temperature disagrees with the negative temperature coefficient of II-IV semiconductor material [29,30]. Several researchers have observed the same trend on various Schottky contacts [12,27,30,31] and they have explained it to be possibly related to the temperature-activated current transport of carriers across the MS interface. These carriers at low temperatures are able to surmount the lower barriers through tunneling and therefore the current will be dominated by transport of charge carriers through the patches of lower SBH.…”
Section: Methodsmentioning
confidence: 88%
See 1 more Smart Citation
“…The observed increase in barrier height with increase in temperature disagrees with the negative temperature coefficient of II-IV semiconductor material [29,30]. Several researchers have observed the same trend on various Schottky contacts [12,27,30,31] and they have explained it to be possibly related to the temperature-activated current transport of carriers across the MS interface. These carriers at low temperatures are able to surmount the lower barriers through tunneling and therefore the current will be dominated by transport of charge carriers through the patches of lower SBH.…”
Section: Methodsmentioning
confidence: 88%
“…The plot shows some linear behavior at high temperatures the temperature is lowered, the current will flow preferentially through the lower barriers in the potential distribution [9,12,14,20,31].…”
Section: Richardson Constantmentioning
confidence: 99%
“…The higher values of n can be attributed to the presence of barrier height inhomogeneities at the interface, minority carrier injections, the image force effect and the formation of a particular distribution state at the semiconductor band gap [11]. Several researchers [8,12] reported a similar behaviour of the barrier height, which disagree with the negative temperature coefficient of resistance in II-IV metal-semiconductors (MS). Another possible explanation of the observed behaviour is the temperature-activated current transport of charge carriers across the MS interface [13].…”
Section: Resultsmentioning
confidence: 99%
“…However, in the case of inhomogeneous barrier potential between metal and semiconductor, the structure's barrier potential is resembled to a barrier consisting of higher and lower patches from which current pass through. Thus, it is possible to explain it through TE theory with the Gaussian distribution of the barrier potential [8].…”
Section: Introductionmentioning
confidence: 99%
“…This means that, the resistance is affected by the applied frequency, which is caused by the dependency of the interface states charges on frequency. At low frequencies, these charges can follow the a. c. signal, and an excess capacity can be formed, that is resulted in the high value of resistance [16,17]. …”
Section: Resultsmentioning
confidence: 99%