2006
DOI: 10.1016/j.nimb.2005.10.023
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Swift ion irradiation induced changes in the structural and transport properties of La0.7Sr0.3MnO3 thin films

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Cited by 6 publications
(2 citation statements)
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“…Therefore, XRR in combination with XRD suggests a significant modification in the microstructural properties both at layer structure length (with sub-nanometer depth resolution) and atomic (XRD) length scale (microstrain growth) due to SHI irradiation. However, the crystalline structure (pseudo-cubic perovskite) of the LPCMO films remains integral to ion irradiation, which is consistent with other studies [30][31][32][33][34].…”
Section: Resultssupporting
confidence: 91%
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“…Therefore, XRR in combination with XRD suggests a significant modification in the microstructural properties both at layer structure length (with sub-nanometer depth resolution) and atomic (XRD) length scale (microstrain growth) due to SHI irradiation. However, the crystalline structure (pseudo-cubic perovskite) of the LPCMO films remains integral to ion irradiation, which is consistent with other studies [30][31][32][33][34].…”
Section: Resultssupporting
confidence: 91%
“…The effect of strain in manganite films is studied in both ways by applying strain (i) directly for substrate-induced strain [22][23][24][25][26], bending strain [4,13,14,19,20], and (ii) indirectly i.e. ion implantation [27][28][29] and swift heavy ion (SHI) irradiation [30][31][32][33][34][35]. The SHI irradiation using 100 MeV O 7+ ions with different fluences of LaMnO 3 / Nd 0.7 Sr 0.3 MnO 3 /STO heterostructure showed a change in strain field across interfaces [35].…”
Section: Introductionmentioning
confidence: 99%