2011
DOI: 10.1016/j.apsusc.2011.09.090
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Surface adhesion and demolding force dependence on resist composition in ultraviolet nanoimprint lithography

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Cited by 44 publications
(40 citation statements)
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“…Compared to using the patterned Si directly as the embossing stamp, the UV resin stamp possesses a lower Young's modulus (600-800 MPa) 56 and a thermal expansion coefficient that is similar to that of PMMA (6 × 10 −5 /°C). This leads to a reduction in the adhesion and thermal stress during thermal embossing of the nanofluidic device 57,58 producing nanofluidic devices with high structural integrity.…”
Section: Resultsmentioning
confidence: 99%
“…Compared to using the patterned Si directly as the embossing stamp, the UV resin stamp possesses a lower Young's modulus (600-800 MPa) 56 and a thermal expansion coefficient that is similar to that of PMMA (6 × 10 −5 /°C). This leads to a reduction in the adhesion and thermal stress during thermal embossing of the nanofluidic device 57,58 producing nanofluidic devices with high structural integrity.…”
Section: Resultsmentioning
confidence: 99%
“…32,33 It was also found that reducing the elastic modulus is effective in reducing release force. 34 With these approaches, the resist design must include consideration of the pot life, chemical contamination on the mold, adhesion to substrate, and etching resistance. Yet despite the approaches listed above, there is no report of success in achieving mold life that can provide the shot number required for industrial use.…”
Section: Release Propertymentioning
confidence: 99%
“…The application of nanoimprint is limited by the yield. Low adhesion force at the de-molding interface is preferred in NIL, to avoid mold sticking and pattern delamination [2]. The adhesion of surfaces on a macro-scale is usually talking about holding two dry, solid surfaces together.…”
Section: Introductionmentioning
confidence: 99%