2008
DOI: 10.1002/pssc.200778534
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Sublimation growth of 2 inch diameter bulk AlN crystals

Abstract: The technology of sublimation growth of 15 mm diameter bulk single AlN crystals is scaled to grow similar 2‐inch diameter crystals. The best results are currently achieved with the two‐stage technique including 1) seeding and initial growth of 2‐3 mm thick single‐crystal AlN layers on 2‐inch diameter 6H‐SiC wafers in pre‐carbonized Ta crucibles in graphite equipment and 2) growth of bulk AlN crystals on the above AlN layers in tungsten crucibles and equipment. The initial AlN layers prove of good crystallograp… Show more

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Cited by 54 publications
(39 citation statements)
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“…This result is attributed to the effect of the residual impurities (primarily Si) that still remain in the AlN bulk crystals grown on the SiC seeds. Repeated use of the initial AlN layer separated from the "primary" crystal (Chemekova et al, 2008) results in high purity material with the resistivity in the range of 3 · 10 9 -3· 10 11 Ohm · cm, which is rather close to the reference values.…”
Section: Properties Of Sublimation-grown Alnsupporting
confidence: 66%
“…This result is attributed to the effect of the residual impurities (primarily Si) that still remain in the AlN bulk crystals grown on the SiC seeds. Repeated use of the initial AlN layer separated from the "primary" crystal (Chemekova et al, 2008) results in high purity material with the resistivity in the range of 3 · 10 9 -3· 10 11 Ohm · cm, which is rather close to the reference values.…”
Section: Properties Of Sublimation-grown Alnsupporting
confidence: 66%
“…Recent results can be found in Refs. [4][5][6][7]. However, the availability of large size, high quality and high purity AlN single crystals grown by PVT still is lacking to date.…”
Section: Introductionmentioning
confidence: 98%
“…AlN bulk single crystals have been grown by the sublimation method [1][2][3][4][5][6][7][8][9][10][11][12][13]. Initially, attention was focused on this method as a way of growing SiC bulk single crystal in the field of semiconductor materials [14].…”
Section: Introductionmentioning
confidence: 99%