Structural determination of amorphous NiTi thin films using electron diffraction analysis

In Situ Synchrotron X‐Ray Diffraction during High‐Pressure Torsion Deformation of Ni and NiTi

“…In the case of the sample 0/135 (i.e., subjected to maximum strain followed by unloading), the following features are encountered: a first broad peak with a maximum occurring at Q ¼ ð2.94 AE 0.05Þ Å À1 and a weaker and rather shallow second peak at Q ¼ ð5.1 AE 0.2Þ Å À1 that is followed by a shoulder-like peak. A similar diffraction pattern of amorphous NiTi alloys is reported in case of different methods such as TEM, [18,53] XRD, [54] and XRD by synchrotron radiation. [23] It should be noted that this profile is rather smooth.…”