Thick polycrystalline films of silver doped YBCO were produced by the standard screen printing method and irradiated with a source of electrons at 1000 kGy. The critical temperature , the zero resistance temperature , the broadening of the superconductor transition and normal resistance, measured at 298 K, changed substantially in the irradiated sample when compared to the non-irradiated specimen. A detailed study using Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) on the cross sectional surface of the films revealed that silver was distributed in small amounts at the grain boundaries while some regions showed silver-rich-like clumps on the surface. In both cases, silver was found in a metallic state only. Such distribution was also confirmed by SEM images. We found by x-ray diffraction analysis important microstructural changes on the irradiated sample. The critical current density showed a sixfold increase after the sample was irradiated. The enhancing is directly associated with the increase in the flux pinning generated by the irradiation induced defects.