2009
DOI: 10.1109/tns.2009.2033691
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Statistical Model Selection for TID Hardness Assurance

Abstract: We investigate model dependence of bounding estimates or TIO degradation as a function of sample size and statistical model and develop a method for selecting the model with greatest predictive power.

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Cited by 22 publications
(10 citation statements)
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References 7 publications
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“…The TID delay per gate increases exponentially with TID, which is consistent with the exponential increase in leakage current shown for the PIC16 part in Fig. 6 and other studies of STI leakage [18]. In Figure 24, the exponential model is shown to fit the data, allowing comparisons between different microcontrollers and forecasts of remaining useful life in the field.…”
Section: Empirical Model Of Maximum Operating Frequencysupporting
confidence: 81%
“…The TID delay per gate increases exponentially with TID, which is consistent with the exponential increase in leakage current shown for the PIC16 part in Fig. 6 and other studies of STI leakage [18]. In Figure 24, the exponential model is shown to fit the data, allowing comparisons between different microcontrollers and forecasts of remaining useful life in the field.…”
Section: Empirical Model Of Maximum Operating Frequencysupporting
confidence: 81%
“…To facilitate accessibility, we have used widely available, open-access tools. Most of the plots in this section are created using the statistical coding language R [20], along with the graphics add-on ggplot2. [21].…”
Section: Presentation Of Resultsmentioning
confidence: 99%
“…Difficulties can arise because environment uncertainties are dependent on the particular orbit, mission duration and environment dynamics. In addition the piece part failure distribution can vary significantly from a mean failure level and is not accounted for by equation 1 [18].…”
Section: Discussion -Radiation Hardness Assurancementioning
confidence: 99%