“…The etched surfaces exhibited root-mean-square roughnesses as low as Table 1 Sample ID, substrate growth temperature, Ga BEP, Hall mobility, electron sheet density, sheet resistance (by CTLM), saturated drain current density (at source-drain voltage V DS ¼ 10 V and gate-source voltage V GS ¼ 0), and gate leakage current 2.8 Å , and the surface morphologies between droplets were similar to those previously reported elsewhere [14,18]. The morphology of regions under Ga droplets in similarly grown samples is consistent with those reported by Kruse et al [19]. However, as yet we have not identified any correlation between AlGaN surface morphology and electronic properties of AlGaN/GaN HEMTs.…”