Some factors influencing the adhesion of films produced by vacuum evaporation

Heavens, O.S.

doi:10.1051/jphysrad:01950001107035500

Cited by 153 publications

(29 citation statements)

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“…The present work applies the neighbour ratio analysis to two metal/polymer systems, Cr/PET (polyethylene teraphthalate) and Cr/PI (polyimide). Cr films on PET and PI are scientifically interesting due to their use as adhesion-promoting layers [27][28][29] for conducting lines on polymer substrates for flexible electronics. They are treated as representatives for brittle films on polymer substrates.…”

Section: Philosophical Magazine 3365mentioning

confidence: 99%

On the limits of the interfacial yield model for fragmentation testing of brittle films on polymer substrates

Taylor

Cordill

Dehm

2012

Philosophical Magazine

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Fragmentation testing is frequently used to probe film fracture strain and the interfacial properties of thin brittle films on compliant substrates. A model based upon complete yield of the film/substrate interface is frequently used to analyse data after cracking has saturated. Additionally, the film is either assumed to have a single-valued failure stress or a distribution of strengths described by Weibull statistics. Recent work by the authors showed that consideration of film thickness variations and the application of neighbour ratio analysis brought 96% of the data for an Al x O y /Cu film/substrate system into compliance with the predictions for a film with a single-valued failure stress. In the present work Cr/PI (polyimide) and Cr/PET (polyethylene teraphthalate) systems are analysed according to the same methodology. The Cr films on polymer substrates crack such that the neighbour ratios considerably exceed the predicted limit of 2. The influence of the relative thickness of the film and substrate and the strain rate of the test is investigated. A deviation from the idealised mechanical model due to the large difference in elastic moduli of film and substrate is put forward as a possible cause of the observed behaviour. The importance of these results to the application of the interfacial yield model is discussed.

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Section: Philosophical Magazine 3365mentioning

confidence: 99%

On the limits of the interfacial yield model for fragmentation testing of brittle films on polymer substrates

Taylor

Cordill

Dehm

2012

Philosophical Magazine

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“…One major experimental difficulty in thin film coating adhesion testing is that of creating a mechanical linkage to the coated film in order to elucidate substrate adherence. The scratch test solves this linkage problem and has often been used to study adhesion [3][4][5][6]. Previously, the lifetime of the TiO 2 thin film was popularly analyzed by contact angle measurement [7].…”

Section: Introductionmentioning

confidence: 99%

Adhesion Strength of TiN Stacked TiO2 Film Correlated with Contact Angle, Critical Load, and XPS Spectra

Parajulee

Hayakawa

Ikezawa

2009

Plasma and Fusion Research

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In order to coat TiO 2 and TiN/TiO 2 films on glass over a large surface area for industrial application, plasma gun and magnetron sputtering processes were used. Also, nitrogen radicals were synthesized on the surface via the atmospheric plasma process. Hydrophilic characteristics were studied via water contact angle. Film adherence was tested via single stylus scratch tester. We also compared the XPS spectra between the nitrogen-synthesized and non-synthesized film and obtained the Ti2p peak shift towards the higher energy level proportional to film adherence. For photocatalytic film durability, the relationship best described, "the higher the critical load, the lower the contact angle, and the higher the binding energy" has become a unique interrelationship among the scratch tester, contact angle, and XPS spectra.

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“…The ÿrst quantitative use of the scratch test was reported by Heavens (1950) and Weaver (1975). Later this method was widely adopted for characterizing the adhesion and mechanical durability of thin hard ÿlms, which typically have a high adhesion strength (Laugier, 1981;Hull et al, 1987).…”

Section: Introductionmentioning

confidence: 99%

Tensile and mixed-mode strength of a thin film-substrate interface under laser induced pulse loading

Wang

Sottos

Weaver

2004

Journal of the Mechanics and Physics of Solids

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Some factors influencing the adhesion of films produced by vacuum evaporation

Cited by 153 publications

References 0 publications

On the limits of the interfacial yield model for fragmentation testing of brittle films on polymer substrates

On the limits of the interfacial yield model for fragmentation testing of brittle films on polymer substrates

Adhesion Strength of TiN Stacked TiO2 Film Correlated with Contact Angle, Critical Load, and XPS Spectra

Tensile and mixed-mode strength of a thin film-substrate interface under laser induced pulse loading

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