SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation

Effective Characterization of Radiation-induced SET on Flash-based FPGAs

“…Most of the works have been performed at a simulation level including technology-based physical equation for the evaluation of the radiation strike and its propagation across the technological cell. The propagation of the transient pulse through the combinational logic data path and routing resources [1] on Flash-based FPGA. Previous work [11] showed that SET propagation depends on many factors such as the shape and width of the initial particle-hit, the path of the SET pulse through the logic cells in terms of fanout and load, the layout of the circuit and the user`s design configuration of the FPGA.…”

“…Once the voltage glitch is generated, it may reach the primary output of a circuit thus provoking a circuit functional interruption. Radiation-hardened by design techniques already provided a solution [1] for reducing their critical impact on design, while a definitive solution for mitigating radiation effects on combinational gates has not been developed yet. Due to the future technology node scaling, it is expected that radiation effects in combinational gates will dominate the future technology sensitive nodes [2].…”

Accurate analysis of SET effects on Flash-based FPGA System-on-a-Chip for satellite applications

“…Several studies have been done in order to analyze the SET phenomenon [2], the propagation of the transient pulse through the combinational logic data path and routing resources [3] on flash-based FPGA. Previous studies focus on the nature of these events.…”

“…In previous work, the Single Event Transient (SET) sensitivity of the FPGA fabric was investigated also including Flip-Flops (FFs) and the large static RAM memory blocks. The characterization was done at various frequencies (ranging from 1 to 10 MHz) providing different probabilities of capturing SET within the combinational gates [3]. Several specific benchmarks were investigated under radiation test campaigns, while the unique SoC evaluated until now consists on an ARM-based Cortex-M3 processor and this was evaluated only with respect to the Single Event Functional Interrupt (SEFI) phenomena.…”

Reliability evaluation on sense-switch p-channel flash

“…FPGA (field programmable gate array) is an important class of integrated circuit device used in aerospace electronics. There are mainly three kinds of FPGAs, the antifuse-based FPGA [1,2] , the flashbased FPGA [3−6] and the SRAM-based FPGA [7,8] . Among them, the antifuse-based FPGA is one-time programmable (OTP) and only a limited density could be reached.…”