Abstract:Temperature plays a decisive role in semiconductor device performance and reliability analysis. The effect is more severe in a Negative Capacitance (NC) transistor, as the temperature modulates the ferroelectric polarization, implicitly included by the Landau coefficients (α, β, γ) in TCAD. In this paper, through TCAD simulations, the role of varying ambient temperature is investigated in the linearity and analog/RF merits of NC-FinFET. The varying temperature modulates the carrier mobility, the semiconductor … Show more
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