Robust optimization based backtrace method for analog circuits

Abstract

In this paper, we propose a new robust approach to signal backtrace for efficiently testing embedded analog modules in a large system. The proposed signal backtrace method is formulated as a solution to a multi-point boundary value problem(BVP), with constraints on the output state and the input. This error constraint minimizes large spurious deviations in the input signal and the convergence problems that arise if multiple solutions exist or if the desired signal does not exist in the feasible signal space. As an additional attractive advantage, this formulation preserves the core iteration structure of a SPICE-like simulator without modifications, greatly easing implementation.