2013
DOI: 10.1007/s00339-013-7831-z
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RF power dependence of refractive index of room temperature sputtered ZnO:Al thin films

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Cited by 4 publications
(2 citation statements)
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“…26 The presence of the interference fringes suggests that high-quality thin films with a flat surface and uniform thickness were obtained. 27 From the transmittance spectra of the ZnS thin films, the refractive index n f corresponding to the near-infrared wavelength region with a weak optical absorption was estimated from 28,29 where n s is the refractive index of the substrate (assumed to be 1.65 for PET). 30 T M and T m are the maximum transmittance and minimum transmittance, respectively, on the envelopes drawn over the peaks for interference oscillations in the transmittance spectra.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…26 The presence of the interference fringes suggests that high-quality thin films with a flat surface and uniform thickness were obtained. 27 From the transmittance spectra of the ZnS thin films, the refractive index n f corresponding to the near-infrared wavelength region with a weak optical absorption was estimated from 28,29 where n s is the refractive index of the substrate (assumed to be 1.65 for PET). 30 T M and T m are the maximum transmittance and minimum transmittance, respectively, on the envelopes drawn over the peaks for interference oscillations in the transmittance spectra.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…The presence of the interference fringes suggests that high-quality thin films with a flat surface and uniform thickness were obtained . From the transmittance spectra of the ZnS thin films, the refractive index n f corresponding to the near-infrared wavelength region with a weak optical absorption was estimated from , where n s is the refractive index of the substrate (assumed to be 1.65 for PET) …”
Section: Resultsmentioning
confidence: 99%