2021
DOI: 10.1021/acsaelm.1c00329
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Resistive Switching in a MoSe2-Based Memory Device Investigated Using Conductance Noise Spectroscopy

Abstract: Resistive random access memory (RRAM) devices are widely considered promising candidates for future memory and logic applications. Though their excellent performances have been reported over the years, resistive switching due to various charge conduction mechanisms is still being debated. Here, we report systematic investigations on resistive switching in a MoSe2-based nonvolatile bipolar memory device by measuring current–voltage characteristics and using low-frequency conductance noise spectroscopy in both l… Show more

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Cited by 14 publications
(7 citation statements)
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“…The detailed preparation method of MoSe 2 NFs has been discussed in our earlier works. [28,57] In brief, a suitable amount of sodium molybdate (Na 2 MoO 4 • 2H 2 O) was added in 22.5 mL dimethylformamide (DMF) solution with 30 min sonication for proper dispersion at room temperature. Next, 15 mg of selenium powder was dispersed in 7.5 mL hydrazine hydrate by constant stirring in an oil bath at 80 °C for 1 h. Then, this solution was mixed with the previously prepared DMF solution to maintain the atomic ratio of Mo:Se as 1:2.…”
Section: Methodsmentioning
confidence: 99%
“…The detailed preparation method of MoSe 2 NFs has been discussed in our earlier works. [28,57] In brief, a suitable amount of sodium molybdate (Na 2 MoO 4 • 2H 2 O) was added in 22.5 mL dimethylformamide (DMF) solution with 30 min sonication for proper dispersion at room temperature. Next, 15 mg of selenium powder was dispersed in 7.5 mL hydrazine hydrate by constant stirring in an oil bath at 80 °C for 1 h. Then, this solution was mixed with the previously prepared DMF solution to maintain the atomic ratio of Mo:Se as 1:2.…”
Section: Methodsmentioning
confidence: 99%
“…In the low-bias condition (0 to −0.53 V), the electric field-injected charges in the CZTS@BOB-PMMA memristive layer are much lower than that of hot carriers; thus, the dominant conduction is mainly the hot-excited carriers, leading to linear Ohmic conduction ( I ∝ V ). While with high applied voltage (−0.53 to 0.64 V), according to Child’s law ( J , current density; ε, dielectric constant; μ, electron mobility; d , thickness of the memristive layer) the fitting result ( I ∝ V 2 ) indicates the charge transport behavior is in good agreement with the trap-assistant SCLC mode, as illustrated in Figure d . After the injected charges fill the traps and could move freely to form conductive channels in the CZTS@BOB-PMMA layer, the device would be set into the LRS state.…”
mentioning
confidence: 83%
“…31 In the low-bias condition (0 to −0.53 V), the electric field-injected charges in the CZTS@BOB-PMMA memristive layer are much lower than that of hot carriers; thus, the dominant conduction is mainly the hot-excited carriers, leading to linear Ohmic conduction (I ∝ V). While with high applied voltage (−0.53 to 0.64 V), according to Child's law (J, current density; ε, dielectric constant; μ, electron mobility; d, thickness of the memristive layer) 21 = J V d…”
Section: T H Imentioning
confidence: 99%
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