Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs

Chen, T. P.; Chan, R.; Fung, S.K.H.; Lo, Kuo-Hsuan

doi:10.1109/19.772206

Cited by 4 publications

(1 citation statement)

References 1 publication

(1 reference statement)

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“…After the TLP pulse, a leakage current test is performed to the DUT, if leakage current increases to some criterion the DUT regards failed and the test stops. This test can evaluate not only IC's ESD level, but also structure such as metal, polycrystalline, a single transistor and even the entire circuit's ESD levels [2]. Compare to conventional human body model and the machine model, TLP method has several advantages:…”

Section: Tlp Test Methodsmentioning

confidence: 99%

Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method

Shi

Xiao

Liu

et al. 2013

2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

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Ionization radiation causes ESD protection structure of integrated circuit degradation. A new method using Transmission Line Pulse (TLP) test is introduced in this article; this method gives more detailed information of the ESD protection structure's degradation. Turn-on voltage, hold voltage, turn-on resistance of two type ESD protection structures are measured before and after TID radiation test, results are discussed.

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Section: Tlp Test Methodsmentioning

confidence: 99%

Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method

Shi

Xiao

Liu

et al. 2013

2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

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TLP calibration, correlation, standards, and new techniques

Barth

Verhaege²,

Henry

et al. 2001

IEEE Trans. Electron. Packag. Manufact.

146

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This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the-curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data.

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