This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the-curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data.

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In this work, we demonstrate that both capacitance and inductance must be the central parameters associated with the Charged Device Model (CDM) waveform verification modules. We also propose a change from the previously used FR-4 dielectric material substrate to a more stable Alumina. This improves waveform repeatability and will lead to better correlation of test results. This paper completes the groundwork for a full ESDA CDM device testing standard.

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Energy‐filtered electron‐diffraction patterns may be of the same interest as X‐ray diagrams in measuring diffuse scattering intensities. By removing the inelastic component from the electron diffracted beam, some diffraction patterns are compared with those obtained by X‐rays from the same materials.