1980
DOI: 10.1063/1.327988
|View full text |Cite
|
Sign up to set email alerts
|

Remote polar phonon scattering in Si inversion layers

Abstract: The effects upon the drift velocity and electron temperatures in silicon inversion layers due to interfacial polar-mode phonons in the Si/SiO2 interface have been calculated at various temperatures. These calculations were carried out at 77, 150, and 300 K using a three-energy-level model for transport in the quasi-two-dimensional inversion layer assuming a drifted-Maxwellian distribution. The effects of the polar interface phonon scattering are compared to the effects of scattering due to Si bulk phonons, int… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
25
0

Year Published

1992
1992
2023
2023

Publication Types

Select...
5
2
2

Relationship

0
9

Authors

Journals

citations
Cited by 55 publications
(25 citation statements)
references
References 9 publications
0
25
0
Order By: Relevance
“…[4][5][6][7] The other is remote optical phonon scattering that has been previously studied by Wang and Mahan, 8 Hess and Vogl, 9 and Moore and Ferry. 10 Fischetti et al 11 noticed that a high dielectric constant means that there are atomic groups in the material which are easily polarized. Easy polarization in its turn means that the frequency of relevant optical phonons is small.…”
Section: Introductionmentioning
confidence: 99%
“…[4][5][6][7] The other is remote optical phonon scattering that has been previously studied by Wang and Mahan, 8 Hess and Vogl, 9 and Moore and Ferry. 10 Fischetti et al 11 noticed that a high dielectric constant means that there are atomic groups in the material which are easily polarized. Easy polarization in its turn means that the frequency of relevant optical phonons is small.…”
Section: Introductionmentioning
confidence: 99%
“…Electrons in the semiconductor can also remotely excite polar optical phonon modes in the dielectrics [13][14][15][16][17][18][19]. Such long-range interactions become stronger as the thickness of the semiconductor layer decreases.…”
mentioning
confidence: 99%
“…Although pristine‐Al was used for the designed Al/Gr/Al interface, amorphous alumina could not be absolutely avoided in the practical Al/Gr/Al interface, which prevents clean contact between the carbon atoms and aluminum atoms. The existence of a small amount of amorphous alumina at the interface not only inhibits the transfer of doped electrons from the metal surface to graphene but also intensifies the scattering of charge carriers on phonons and reduces the mobility in graphene. The removal of alumina on the surface of Al foil and the prevention of aluminum matrix oxidation during the introduction of graphene are the key to reduce the impurities of alumina in the interface of composite materials.…”
Section: Discussionmentioning
confidence: 99%