2004
DOI: 10.1017/cbo9780511735097
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Reflection High-Energy Electron Diffraction

Abstract: Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHE… Show more

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Cited by 268 publications
(254 citation statements)
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“…As seen in Fig. 1(b), the streak pattern observed along the Laue circles and the strongly developed Kikuchi lines clearly exclude the possibility of faceted morphology of the bare LAO (111) substrate 23 . Furthermore, as seen in Fig.…”
mentioning
confidence: 65%
“…As seen in Fig. 1(b), the streak pattern observed along the Laue circles and the strongly developed Kikuchi lines clearly exclude the possibility of faceted morphology of the bare LAO (111) substrate 23 . Furthermore, as seen in Fig.…”
mentioning
confidence: 65%
“…[7,14]. Fig.2 (d-f) shows that growth of Cu 2 O on MgO (1 1 0) starts in the Volmer-Weber or island regime, and the islands eventually merge to form a smooth and continuous film with some surface disorder as evidenced by the streaky nature of the pattern [15]. Note that the RHEED pattern corresponds to only a single orientation of the film, which indicates that nucleation of the second orientation is not spatially uniform and most likely predominates away from the center of the sample.…”
Section: Growth Using Pure Oxygen Plasmamentioning
confidence: 96%
“…However, CAICISS requires samples with relatively large dimensions. Compared with these methods, reflection high-energy electron diffraction (RHEED) [7] is a simple technique. We can obtain RHEED patterns during crystal growth.…”
Section: Introductionmentioning
confidence: 99%