2015
DOI: 10.1016/j.jcrysgro.2014.10.045
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Single phase, single orientation Cu2O (1 0 0) and (1 1 0) thin films grown by plasma-assisted molecular beam epitaxy

Abstract: This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain. AbstractEpitaxial growth of cuprou… Show more

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Cited by 13 publications
(4 citation statements)
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“…o is due to Cu 2 O(110) as confirmed from literature. [18] A characteristic XRD peak at 28 o was also observed for base Si(111) as shown in Fig. 2b.…”
Section: Resultsmentioning
confidence: 71%
“…o is due to Cu 2 O(110) as confirmed from literature. [18] A characteristic XRD peak at 28 o was also observed for base Si(111) as shown in Fig. 2b.…”
Section: Resultsmentioning
confidence: 71%
“…XRD spectra for films synthesized by Solution-1 and Solution-2 and annealed for 1hr at 200 o C are shown in Fig.2(a) proven by density functional theory calculations [26,27] that, under oxygen-rich conditions, Cu 2 O (110) has the lowest surface energy. Such oxygen-rich environment for this film was confirmed by the XPS measurement as we will show shortly.…”
Section: Accepted Manuscriptmentioning
confidence: 95%
“…The semiconductor cuprous oxide (Cu 2 O) has been shown to fulfill these criteria and is considered a promising candidate, which can be easily produced by inexpensive electrochemical [5][6][7] or thermal annealing [8] methods. Cu 2 O is a p-type semiconductor which has suitable band positions for PEC water splitting with the conduction band located 0.7 V more negative than the hydrogen evolution reaction (HER) potential [9] and a direct bandgap of *2.0-2.3 eV, depending on the fabrication process [10][11][12][13].…”
Section: Graphical Abstract Introductionmentioning
confidence: 99%