Quality assessment of ZnO-based varistors by 1/f noise

Transport mechanisms in Co-doped ZnO (ZCO) and H-irradiated ZCO polycrystalline thin films

“…52 Furthermore, the HZCO noise level is found up two orders of magnitude lower than that reported for ZnO films deposited on Pt substrates, 50 for Al-doped ZnO films deposited in the temperature range (200-400) 1C, 51 and for ZnO-based varistor structures. 53 The above experimental results indicate therefore the HZCO material as a good candidate for technological applications.…”

“…4a is expected in the case of films with oriented crystalline structure, as already reported for ZnO samples deposited on glass and Pt/Si substrates, 50 for Al-doped ZnO thin films, 51,52 and for ZnO-based varistors. 53 The study of the bias current dependence of the 1/f amplitude has also been performed, since it is a valuable method capable for extracting useful information about the electrical transport mechanisms at work, as extensively reported for a large variety of materials, such as magnetic compounds, [54][55][56][57] superconducting thin films and devices, 58,59 and carbon nanotube composites. [60][61][62] Fig.…”

kHz Linewidth Laser Characterization using Low Frequency and Excess Noise Measurements

“…The measured LFN can indicate internal defects in the active region and can be used to assess the device performance, including the lifetime of a semiconductor laser [4]. Therefore, the LFN measurement can be used as an effective, nondestructive testing method to assess the property and reliability of LD [10], [18]. Electric aging tests, as a traditional and destructive examination method, are commonly used to assess the reliability of diode lasers [19].…”

“…The measured LFN can so be used to assess the device performance and lifetime of the semiconductor lasers [4]. Therefore, the LFN measurement can be used as an effective nondestructive testing method to assess the property and reliability [10], [18].…”

Application of infrared thermography to non-contact testing of AD/DC power supply

“…Particularly significant are such testing and fault identification methods that enable diagnostics without interfering with a tested system or tested components. The examples of such solutions (nondestructive testing) are: quality (reliability) evaluation on the basis of inherent noise [1][2][3][4][5][6][7], Resonant Ultrasound Spectroscopy technique [8] or infrared thermography inspections [9][10][11][12][13][14][15][16].…”