In the present study, random current fluctuations measured at different temperatures and for different illumination levels are used to understand the charge carrier kinetics in methylammonium lead iodide CH3NH3PbI3‐based perovskite solar cells. A model, combining trapping/detrapping, recombination mechanisms, and electron–phonon scattering, is formulated evidencing how the presence of shallow and deeper band tail states influences the solar cell recombination losses. At low temperatures, the observed cascade capture process indicates that the trapping of the charge carriers by shallow defects is phonon assisted directly followed by their recombination. By increasing the temperature, a phase modification of the CH3NH3PbI3 absorber layer occurs and for temperatures above the phase transition at about 160 K the capture of the charge carrier takes place in two steps. The electron is first captured by a shallow defect and then it can be either emitted or thermalize down to a deeper band tail state and recombines subsequently. This result reveals that in perovskite solar cells the recombination kinetics is strongly influenced by the electron–phonon interactions. A clear correlation between the morphological structure of the perovskite grains, the energy disorder of the defect states, and the device performance is demonstrated.

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A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to explain the origin of random current fluctuations in silicon-based solar cells. In this framework, the comparison between dark and photo-induced noise allows the determination of important electronic parameters of the defect states. A detailed analysis of the electric noise, at different temperatures and for different illumination levels, is reported for crystalline silicon-based solar cells, in the pristine form and after artificial degradation with high energy protons. The evolution of the dominating defect properties is studied through noise spectroscopy.

A detailed electric noise investigation of polymer:fullerene solar cells, at 300 K under dark conditions, is reported. The experimental noise results are interpreted in terms of a model taking into account the device capacitance and recombination resistance. Relevant parameters of the solar cells can be computed through fluctuation spectroscopy, and the results have been compared with those obtained by alternative techniques. After a thermal treatment at 340 K, a modification of the voltage-spectral traces has been observed and related to a strong cell resistance reduction

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