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The electrical noise of capacitors and the relationship between typical imperfections in capacitors and their excess noise are described. It was assumed that a noisy capacitor is a poor‐quality one. Investigations were aimed at the determination of a correlation between the inherent noise of capacitors and their reliability (time to failure) and also at the determination of an indicator to predict reliability. Investigations (noise measurements and reliability tests) were carried out on two samples of aluminium electrolytic capacitors. The method of reliability prediction for electrolytic capacitors based on their low‐frequency noise is described. For reliability prediction the noise intensity G at a frequency of 2 Hz was used as a reliability indicator. It was found that the evaluated correlation coefficients between the noise parameter G and the time to failure, t, are statistically significant. It is concluded that it is possible to predict the lifetime of aluminium electrolytic capacitors on the basis of their 1/f noise. © 1998 John Wiley & Sons, Ltd.

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