2012
DOI: 10.1016/j.apsusc.2012.02.148
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Pulsed laser deposition of transparent conductive oxide thin films on flexible substrates

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Cited by 65 publications
(38 citation statements)
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“…Tensile stresses in AZO and ITO films on PET films and crack formation have been observed by XRD and AFM measurements[16,32]. A reduction of crack formation in AZO/PET films was observed for large target-substrate distances in PLD[10]. For thicker AZO films the stress relaxation was apparently not sufficient to avoid the cracking of the oxide layer (Fig.…”
mentioning
confidence: 92%
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“…Tensile stresses in AZO and ITO films on PET films and crack formation have been observed by XRD and AFM measurements[16,32]. A reduction of crack formation in AZO/PET films was observed for large target-substrate distances in PLD[10]. For thicker AZO films the stress relaxation was apparently not sufficient to avoid the cracking of the oxide layer (Fig.…”
mentioning
confidence: 92%
“…The growth of high-quality AZO thin films is challenging because of stability issues regarding the polymers. Al-doped ZnO films were deposited on polyethylene terephthalate and other polymer substrates by PLD [7,8,9,10,11] and sputtering techniques [12,13,14,15,16]. Organic solar cells (OSC) with rapidly advancing solar radiation-to-electric power conversion efficiencies [17,18,19,20,21] are very promising for photovoltaic devices in energy conversion applications.…”
Section: Introductionmentioning
confidence: 99%
“…For example, transparent conducting oxides (TCOs) are used as essential materials for photovoltaic devices, 1 flexible electronics, 2 and optoelectronic applications. 3 TCOs such as indium tin oxide (ITO), 4 F-doped tin oxide (FTO), 5 and Al-doped zinc oxide 6 exhibit large conductivities with their typical carrier densities larger than 10 20 cm −3 in the degenerately doped regime.…”
mentioning
confidence: 99%
“…The sample ITO1 presents the lowest transparency (70-75%) that is being attributed to the presence of some defects (cracks) generated during a deposition process at this distance and the defects that scatter the light. In PLD, the deposition appears as species with an increased kinetic energy that can affect the deposition substrate and the way in which this takes place is the nucleation process [1]. Defects can appear due to the energy transferred through the collision of the energetic items such as atoms, ions, and molecules, with the substrate atoms or with the atoms previously deposited.…”
Section: Indium Tin Oxide (Ito)mentioning
confidence: 99%
“…An excimer laser with KrF* (model COMPex-Pro 205, Lambda Physics-Coherent), λ = 248 nm, and τ FWHM = 25 nm was used to irradiate the ITO target (SCI engineered materials) in an ultrahigh vacuum chamber [1]. The depositions were made at room temperature, at 2 J/cm 2 laser fluence, and with 10 Hz repetition rate.…”
Section: Indium Tin Oxide (Ito)mentioning
confidence: 99%