2013
DOI: 10.1088/1674-1056/22/10/108505
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Performance enhancement of an InGaN light-emitting diode with an AlGaN/InGaN superlattice electron-blocking layer

Abstract: Jian-Yong(熊建勇) a) , Xu Yi-Qin(许毅钦) b) , Zhao Fang(赵 芳) a) , Song Jing-Jing(宋晶晶) a) , Ding Bin-Bin(丁彬彬) a) , Zheng Shu-Wen(郑树文) a) , Zhang Tao(张 涛) a) , and Fan Guang-Han(范广涵) a) †

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Cited by 3 publications
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“…It is noted that AlGaN and InGaN component layers of the short period superlattices on the InGaN template layer involve compressive and tensile strain, respectively, because each component layer is thinner than its critical layer thickness, and thus the properly designed InGaN/AlGaN superlattices can compensate for mismatch-induced strain and be employed as the strain-compensated barrier layer for InGaNbased MQWs. [18,19] Each AlGaN or InGaN component layer is occupied simultaneously by its upper and under layer, leading to the formation of good in-plane uniformity for AlInGaN without spatial compositional (or strain) fluctuation. This is why there are no other nitrides-related peaks in XRD profiles, such as In-rich clusters.…”
Section: Resultsmentioning
confidence: 99%
“…It is noted that AlGaN and InGaN component layers of the short period superlattices on the InGaN template layer involve compressive and tensile strain, respectively, because each component layer is thinner than its critical layer thickness, and thus the properly designed InGaN/AlGaN superlattices can compensate for mismatch-induced strain and be employed as the strain-compensated barrier layer for InGaNbased MQWs. [18,19] Each AlGaN or InGaN component layer is occupied simultaneously by its upper and under layer, leading to the formation of good in-plane uniformity for AlInGaN without spatial compositional (or strain) fluctuation. This is why there are no other nitrides-related peaks in XRD profiles, such as In-rich clusters.…”
Section: Resultsmentioning
confidence: 99%