2016
DOI: 10.1002/sdtp.10835
|View full text |Cite
|
Sign up to set email alerts
|

P-7: High Performance LTPS Thin-film Transistors using Low Cost Polycrystalline Silicon by Blue Laser Annealing

Abstract: Crystallization of amorphous silicon (a-Si) to polycrystalline silicon (p-Si) by a continuous-wave blue laser diode of wavelength 445 nm is investigated for high throughput thin-film transistor applications (TFT). As the laser scan speed is changed at constant laser power, laser scanned p-Si films show three kinds of grain shape that can be distinguished according to grain growth mechanism: (1) solid phase crystallization (SPC), (2) partial melting growth (PMG), and (3) full melting growth (FMG). These three g… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
8
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
5

Relationship

3
2

Authors

Journals

citations
Cited by 6 publications
(8 citation statements)
references
References 22 publications
(18 reference statements)
0
8
0
Order By: Relevance
“…First, a solution-processed carbon-nanotube (CNT): graphene-oxide (GO) mixed layer is spray-coated on carrier glass and cured at 290 C. Transparency of the fabricated CNT:GO backbone film is around 90% as shown in Figure 1B. Then, PI solution is spin-coated to a thickness of $10 μm, followed by curing at $470 C for 2 h. The CNT:GO layer reduces the adhesion of the PI on glass and thus can be used as a buffer for mechanical detachment, [13][14][15][16] which is shown in Figure 1A (iii). After the formation of PI substrate, a gas barrier consisting of SiO 2 /SiN x multilayer is deposited through plasma-enhanced chemical vapor deposition (PECVD).…”
Section: Device Fabricationmentioning
confidence: 99%
See 2 more Smart Citations
“…First, a solution-processed carbon-nanotube (CNT): graphene-oxide (GO) mixed layer is spray-coated on carrier glass and cured at 290 C. Transparency of the fabricated CNT:GO backbone film is around 90% as shown in Figure 1B. Then, PI solution is spin-coated to a thickness of $10 μm, followed by curing at $470 C for 2 h. The CNT:GO layer reduces the adhesion of the PI on glass and thus can be used as a buffer for mechanical detachment, [13][14][15][16] which is shown in Figure 1A (iii). After the formation of PI substrate, a gas barrier consisting of SiO 2 /SiN x multilayer is deposited through plasma-enhanced chemical vapor deposition (PECVD).…”
Section: Device Fabricationmentioning
confidence: 99%
“…The detailed fabrication process of the p-channel LTPS TFTs on PI substrate appears elsewhere. 11,13 A SiO 2 buffer layer is deposited on PI film, and then a-Si was formed by PECVD at the substrate temperature of 360 C with its thickness of 50 nm for ELA and 100 nm for BLA, respectively. After the dehydrogenation at 450 C, the a-Si layers are crystallized by BLA or ELA.…”
Section: Device Fabricationmentioning
confidence: 99%
See 1 more Smart Citation
“…The crystallization of amorphous silicon (a‐Si) on glass substrate can be possible by using solid phase crystallization (SPC), metal‐induced crystallization (MIC), ELA, and continuous wave (CW) laser annealing. Because of no intradefects in the grains, the ELA poly‐Si is widely used for the manufacturing of AMOLED and active‐matrix liquid crystal display (AMLCD) .…”
Section: Introductionmentioning
confidence: 99%
“…Another important merit of BLA poly-Si is no protrusion in the TFT channel. [60][61][62][63] The grain boundary defects at the protrusion can degrade the TFT performance, [69][70][71][72][73] and also affect the bias stability and mechanical bending stability. [74,75] The flexibility of the ELA TFTs on PI substrates can be a big issue for the foldable and rollable AMOLED displays.…”
Section: Introductionmentioning
confidence: 99%