2006
DOI: 10.1063/1.2335777
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Noise in carbon nanotube field effect transistor

Abstract: Low frequency noise power spectrum density of carbon nanotubes is presented. It is shown that the input-referred noise of carbon nanotubes increases quadratically as gate voltage is overdriven, suggesting that mobility fluctuation is the dominant mechanism contributing to the noise in carbon nanotube field effect transistors. The comparison of source-drain current noise power spectrum densities of carbon nanotubes in air and in vacuum indicates that a part of device noise is due to charge fluctuations from att… Show more

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Cited by 46 publications
(47 citation statements)
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“…Experiments with CNTs in air versus vacuum suggest that charge fluctuations of adsorbed atmospheric contaminants on the surface of the CNT cause 1/f noise [23]. There are several possible causes of the residual 1/f in the current noise spectra after irradiation.…”
Section: Fourier Analysis Of the Drain Current Noisementioning
confidence: 99%
“…Experiments with CNTs in air versus vacuum suggest that charge fluctuations of adsorbed atmospheric contaminants on the surface of the CNT cause 1/f noise [23]. There are several possible causes of the residual 1/f in the current noise spectra after irradiation.…”
Section: Fourier Analysis Of the Drain Current Noisementioning
confidence: 99%
“…However, the total amount of noise in the in the CNT-based sensor system is highly dependent on a number of sources related to the design of the sensor system and the conditions under which the sensor is manufactured and tested. For example, the amount of flicker noise in the sensor is higher when the sensor is exposed to the environment compared to when it is tested in a vacuum [8]. This indicates that molecules that are absorbed onto the surface of the CNT can act as extra scattering sites and significantly increase the noise in the sensor [9].…”
Section: Introductionmentioning
confidence: 93%
“…However, the total amount of noise in the in the CNT-based sensor system is highly dependent on a number of sources related to the design of the sensor system and the conditions under which the sensor is manufactured and tested. For example, the amount of flicker noise in the sensor is higher when the sensor is exposed to the environment compared to when it is tested in a vacuum [5]. This indicates that molecules that are absorbed onto the surface of the CNT can act as extra scattering sites and significantly increase the noise in the sensor [6].…”
Section: Introductionmentioning
confidence: 96%