New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs

Arbet, Daniel; Stopjaková, Viera; Majer, Libor; Gyepes, Gábor; Nagy, Gabriel

doi:10.1109/tnano.2013.2251656

Cited by 22 publications

(11 citation statements)

References 27 publications

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“…However, accuracy and the practical application of this method depend on the type of describing function. In [1,4,6,[18][19][20], it has been demonstrated that in the most cases (from the test efficiency point of view), shorts represent the hardest detectable faults when considering application of the oscillation test. This is due to the fact that short faults with a high value of the short resistance do not have a substantial influence on the CUT parameters.…”

Section: Related Workmentioning

confidence: 99%

“…The novel approach to increasing the fault detectability in analog and mixed-signal integrated circuits designed in nanotechnology, presented in [1,2], is based on the oscillation test. In the oscillation-based test, a CUT is transformed into an oscillator by connecting proper feedback circuitry [2][3][4][5][6][7][8][9][10].…”

Section: Introductionmentioning

confidence: 99%

“…There is an assumption that the appropriate value of the oscillation frequency might increase the total fault coverage (FC) in the tested circuit. Thus, this paper presents results of the investigation of the optimum oscillation frequency towards increasing the efficiency of the on-chip oscillation test approach (proposed and described in [1]). In Section 2, the preliminary work done in the respective area is presented.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Arbet

Stopjaková

Kovac

2015

Microelectronics Reliability

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Section: Related Workmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Arbet

Stopjaková

Kovac

2015

Microelectronics Reliability

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“…During the test mode, each building block of circuit is converted into an oscillator by adding the proper circuitry in order to achieve sustained oscillation. The oscillation is then evaluated [10]. The fault is revealed from a deviation of its oscillation parameters with reference to the parameters below the fault free conditions.…”

Section: Oscillation Based Bist Of Analog/mixed Signal Circuits (Obist)mentioning

confidence: 99%

Analog and Mixed Signal Test Method based on OBIST Technique

KumarOjha¹,

Akashe²

2015

IJCA

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This paper describes a test method for analog and mixed signal device at very low cost and it"s based on OBIST (oscillation test) method. This method is built-in self test method appropriate for functional and structural testing of analog and mixed signal circuit. In test mode, the test circuit is converted into an oscillator. Then faults inside the test circuit that cause an affordable deviation of the oscillation frequency from its value are detected. Through this test method, no test vector is required to apply. Therefore in this test technique, the test vector generation drawbacks are eliminated and also the test time is reduced because limited number of oscillation frequencies is evaluated for each test circuit. This characteristic implies that Oscillation-test methodology is very attractive for further wafer-probe testing as final production testing. During this paper, the simulation results of this test method has been provided and verified throughout some examples like CMOS inverter and FET (field effect transistor).

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“…That is also one of the reasons why alternative parametric test methods such as I DDQ test [1], [2], [3], [4], oscillation test method [5], [6], [7], [8] or pole location evaluation [9], [10] are gaining more attention in the last years. These methods are capable of high fault coverage while the test application time is rather short, and thus, creating a promising test approach for primary fault screening during the final production test.…”

Section: Introductionmentioning

confidence: 99%

Impedance calculation methodology for fault simulation of analog and mixed-signal circuits

Brenkuš

Stopjaková

Arbet

et al. 2014

2014 24th International Conference Radioelektronika

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A novel impedance fault simulations methodology is presented in this paper. This methodology is based on an equation that calculates two-point impedance using the eigenvalues and eigenvectors of the circuit's nodal admittance matrix. This approach is applicable to active and passive circuits in both DC and AC domains. Possible applications of the proposed methods in the design of integrated circuits are presented as well.

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New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs

Cited by 22 publications

References 27 publications

Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Analog and Mixed Signal Test Method based on OBIST Technique

Impedance calculation methodology for fault simulation of analog and mixed-signal circuits

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