Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Arbet, Daniel; Stopjaková, Viera; Kovac, Martin

doi:10.1016/j.microrel.2015.03.017

Cited by 8 publications

(8 citation statements)

References 24 publications

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“…It is possible to maintain both reference frequency sources in an OBIST system for two-step testing of a CUT, but the test time accordingly increases. Another approach to increase catastrophic fault coverage is to increase the oscillation frequency [12], but there is a need to change the value of the component with a high sensitivity to oscillation frequency, which outcomes in testing of modified CUT. Thus, the test results cannot be covered for a non-modified circuit.…”

Section: Discussionmentioning

confidence: 99%

“…A fault detectability is defined as the sensitivity of oscillation frequency to variations of the component. To increase the detectability of catastrophic faults, the sensitivity of CUT oscillation frequency could be increased by manipulating one of component's value [10,12]. Manipulations of parameters in CUT means change of the initial circuit of the tested device, which can lead to non-guaranteed reliability of test results for the designed parameters.…”

Section: H(z)mentioning

confidence: 99%

“…In addition, a feedback circuit of the used OBIST system was tolerant to CMOS processed and mismatch variations. It needs to be mentioned that other studies used capacitor tuning to change the oscillation frequency of the OBIST system, thus, increasing the range of catastrophic fault coverage [12]. Figure 16 shows the variations of the oscillation frequency of a second-order Sallen-Key LPF by changing the value of every passive component in range of -20% to +20%.…”

Section: Fault Coverage Of Parametric Faultsmentioning

confidence: 99%

“…In other works, the oscillation based built-in self-test (OBIST) method has been implemented in low operating frequency filters [9], tested on discrete boards [5,6], thus implementation in CMOS technology has not been analyzed. In other studies, the proposed test method has been implemented in CMOS technology [10][11][12] and investigated on feedback circuit impedance matching [13], but investigation on different structures of filters and natural, non-pre-tuned fault estimation systems, is limited. It is also common to use fault tables [14] for pre-simulated systems, but this approach is not suitable when CUT is composed of large number of components or when there is a need for universal and easy implementation in different structure testing systems.…”

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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In this paper, an oscillation-based built-in self-test system for active an analog integrated circuit is presented. This built-in self-test system was used to detect catastrophic and parametric faults, introduced during chip manufacturing. As circuits under test (CUT), second-order Sallen-Key, Akerberg-Mossberg and Tow-Thomas biquad filters were designed. The proposed test hardware detects parametric and catastrophic faults on changeable limits. The influence of both oscillation and test hardware on fault detection limits were investigated and analyzed. The proposed oscillation based self-test system was designed and simulated in 0.18 µm complementary metal-oxide semiconductor (CMOS) technology. Due to the easiness of implementation and configuration for testing of different active analog filters, such self-test systems can be effectively used in modern integrated circuits, made of a large number of devices and circuits, such as the multi-standard transceivers used in the core hardware of software-defined radios. Using the proposed test strategy, the fault tolerance limits for catastrophic faults varied from 96% to 100% for all injected faults in different structures of low pass filters (LPF). The detection range of parametric faults of passive components’ nominal value, depending on the used structure of the filter, did not exceed –0.74% – 0.72% in case of Sallen-Key, –3.31% – 1.00% in case of Akerberg-Mossberg and –2.39% – 1.44% in case of Tow-Thomas LPF.

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Section: Discussionmentioning

confidence: 99%

Section: H(z)mentioning

confidence: 99%

Section: Fault Coverage Of Parametric Faultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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“…Using an on-chip Schmitt trigger as the frequency reference, [28] applied the oscillation-based built-in self-test (OBIST) strategy to low-pass and high-pass analogue filters designed in 0.35μm and 90nm CMOS technologies respectively. To increase the efficiency of the on-OBIST approach, [29] investigated the optimum value of the oscillation frequency, and focused on fault coverage for R short only.…”

Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

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OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

Khade

Chaudhari²

2017

International Journal of Electronics

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Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

Cited by 8 publications

References 24 publications

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

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