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1988
DOI: 10.1063/1.100318
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New doping method for subhalf micron trench sidewalls by using an electron cyclotron resonance plasma

Abstract: A new doping method for the vertical sidewall of a trench by electron cyclotron resonance plasma is described. The plasma was produced under a pressure of 5×10−4 Torr. A doped layer was formed uniformly along the sidewall of a trench with subhalf micron width and an aspect ratio of 6.2. By using a de-ionized water cooling system, the wafer temperature was maintained below 120 °C and the boron dopant was introduced without damage to the photoresist.

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Cited by 126 publications
(34 citation statements)
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“…Due to the high mobility of electrons, positive bias will not increase sheath thickness considerably unless the bias generator can handle the very large electron current that can be drawn from the plasma, Eq. (18). In this case, a new situation may arise, namely that the bias generator becomes part of the plasma-generating system, rather than the plasma-utilizing system.…”
Section: Transient Sheathsmentioning
confidence: 99%
See 1 more Smart Citation
“…Due to the high mobility of electrons, positive bias will not increase sheath thickness considerably unless the bias generator can handle the very large electron current that can be drawn from the plasma, Eq. (18). In this case, a new situation may arise, namely that the bias generator becomes part of the plasma-generating system, rather than the plasma-utilizing system.…”
Section: Transient Sheathsmentioning
confidence: 99%
“…Adler [16], Conrad [17], Mizuno [18], and others. By lowering pulsed bias from 10's of kV to much smaller values, and using condensable metal plasmas, plasma immersion technology was expanded into the field of interface engineering and film formation by energetic condensation [19].…”
Section: And Pulsed Substrate Biasmentioning
confidence: 99%
“…As conventional implanters are not adapted to very low ion energies, implantation of doping elements via PBII processing with a collisional sheath is becoming a useful tool for shallow implantation. Plasma doping (or PLAD) thus constitutes, by far, the most important application of PBII in microelectronics [10,21,23,[126][127][128][129][130][131][132][133][134], along with the production of SOI (silicon on insulator) wafers with the smart-cut process [135][136][137][138].…”
Section: Plasma Dopingmentioning
confidence: 99%
“…Already in the late 1980s, the concept of high-energy implantation of gaseous ions was extended to a process of lower bias voltage and energy that is suitable for doping of trenches of semiconductors [39,40]. Because the sheath dimension (millimeters or centimeters) is much larger than the dimension of the trenches (micrometer or less), ions can reach the sidewall of trenches only by collisions.…”
Section: Concept 5 Trench Doping Using Collisional Piii Sheathmentioning
confidence: 99%