Near-field optical microscope using a silicon-nitride probe

Hulst, Niek F. van; Moers, M.H.P.; Noordman, O.F.J.; Tack, R. G.; Segerink, Franciscus B.; Bölger, B.

doi:10.1063/1.108933

Cited by 109 publications

(41 citation statements)

References 11 publications

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“…Van Hulst et al overcame some of these disadvantages, introducing a combined scanning force microscope (SFM) and photon scanning tunneling microscope (PSTM). Commercially available silicon nitride cantilevers with pyramidal tips were employed as optical near-field probes in both transmission and reflection mode [5,6]. On the basis of this concept other approaches were recently presented where SFM cantilevers were modified in a single manufacturing process [7][8][9][10].…”

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confidence: 99%

Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy

Werner¹,

Rudow²,

Mihalcea³

et al. 1998

Applied Physics A: Materials Science & Processing

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In this paper we present the application of cantilever based sensors combining scanning force microscopy (SFM) and scanning near-field optical microscopy (SNOM). Microstructure technology processes are employed to fabricate probes with reproducible mechanical and optical properties for both SFM and SNOM applications. The cantilever probe allows simultaneous measurement of the sample topography and the optical transmission of samples with high lateral resolution. The probe consists of a hollow metal tip integrated in a conventional silicon cantilever. The pyramidal tip has at its apex an aperture of sub-wavelength dimensions which is used as a confined light source. Because the tip opening angle is 70.5 • the extent of the tapering region is in the order of a quarter wavelength, which improves the optical transmission efficiency and avoids thermal effects.The probes were optically characterized. In particular the polarization properties of the optical aperture have been investigated in the far field as well as the near field. Furthermore, preliminary magneto-optical measurements have been performed on a thin garnet film to demonstrate the usefulness of the probes in view of their application in polarization near-field optical microscopy.

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mentioning

confidence: 99%

Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy

Werner¹,

Rudow²,

Mihalcea³

et al. 1998

Applied Physics A: Materials Science & Processing

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“…Based on the distance control system of Z axis that maintains the distance between the probe and the sample, the SNOM modes are mainly classified into STM [173], transient light intensity [174], shear force [175], and AFM [176][177][178][179]. The AFM mode SNOM uses an AFM cantilever as an optical probe.…”

Section: Nano-diagnosis and Nano-sensing System Using Snoammentioning

confidence: 99%

The principles and applications of nano-diagnosis system for a nano-biosensor

Kim

Chang

Muramatsu

et al. 2011

Korean J. Chem. Eng.

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In this review, the basic principles and research trends of biosensors are briefly described and a nano-sensing system applying QCM (quartz crystal micro-balance), nano-diagnosis methods by AFM (atomic force microscopy) and SNOAM (scanning near-field/atomic force microscopy) is discussed intensively. The principle, construction, and applications of piezoelectric crystal sensors as a universal sensor are reviewed. This review is focused mainly on liquid phase applications, such as immune-sensors, gelation detecting sensors, and cultured cell monitoring sensors. The principle of nano-diagnosis based on the AFM or SNOAM techniques is described in detail. Finally, the binding affinity of peptide probes to proteins using AFM and the visualizing of a hybridized PNA probe on a DNA molecule using SNOAM are evaluated and discussed.

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“…1. The combination atomic force microscopy (AFM) and NSOM tip is a hollow aluminum pyramid integrated on a Si cantilever that converts the evanescent field to a propagating wave by locally frustrated total internal reflection [6]. A photomultiplier tube is aligned to a subwavelength diameter pinhole centered in the tip to detect the wave emanating from the tip that is proportional to the evanescent field.…”

Section: Experimental Apparatusmentioning

confidence: 99%