2009 10th International Symposium on Quality of Electronic Design 2009
DOI: 10.1109/isqed.2009.4810400
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NBTI aware workload balancing in multi-core systems

Abstract: Abstract-As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such as Negative Bias Temperature Instability (NBTI). Unless this problem is addressed, chip multi-processor (CMP) systems face low yields and short mean-time-to-failure (MTTF). This paper proposes a new design framework for multi-core system that includes device wear-out impact. Based on device fractional NBTI model, we propose a ne… Show more

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Cited by 20 publications
(19 citation statements)
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References 11 publications
(10 reference statements)
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“…The results of the RTL simulation are given in Table 2: for each functional unit of interest, the number of PMOS transistors and the number of PMOS transistors that are stressed (as an average over the input vector configurations) is reported. Notice that the statistics reported in Table 2 are slightly different than the 50% assumption made in [17], providing a more precise and accurate evaluation methodology.…”
Section: Resultsmentioning
confidence: 95%
See 3 more Smart Citations
“…The results of the RTL simulation are given in Table 2: for each functional unit of interest, the number of PMOS transistors and the number of PMOS transistors that are stressed (as an average over the input vector configurations) is reported. Notice that the statistics reported in Table 2 are slightly different than the 50% assumption made in [17], providing a more precise and accurate evaluation methodology.…”
Section: Resultsmentioning
confidence: 95%
“…For leakage power, this is in the order of 10% [23]. The authors in [18,17] on the other hand, exploit the recovery phase typical of the NBTI process in order to mitigate degradation. The authors address emerging multicore architectures, proposing a workload balancing scheme [17] that aims at alternating cores between full workload phases and recovery phases.…”
Section: Related Workmentioning
confidence: 99%
See 2 more Smart Citations
“…By collecting precise information about how frequently the process creates child processes and how long the child processes execute by system calls. Jin Sun, Avinash Kodi, Ahmed Louri, and Janet M. Wang proposes [13] a new design framework for multicore system that includes device wear-out impact. Based on device fractional NBTI model.…”
Section: Fig 1 Basic Process For Balancing Loadmentioning
confidence: 99%