2014
DOI: 10.1016/j.micpro.2013.11.009
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Unified reliability estimation and management of NoC based chip multiprocessors

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Cited by 21 publications
(23 citation statements)
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“…10,11 Also, reliability has become a primary design concern alongside traditional design objectives. 12,13 However, the majority of the previous work did not consider uncertainty or reliability in the design process of embedded systems. The studies in 14,15 are recent attempts to capture uncertainty in the process of optimization of embedded systems.…”
Section: Related Workmentioning
confidence: 99%
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“…10,11 Also, reliability has become a primary design concern alongside traditional design objectives. 12,13 However, the majority of the previous work did not consider uncertainty or reliability in the design process of embedded systems. The studies in 14,15 are recent attempts to capture uncertainty in the process of optimization of embedded systems.…”
Section: Related Workmentioning
confidence: 99%
“…In such situations, a Monte Carlo simulation based technique represents the only effective technique that is capable of accommodating multiple types of probability distributions. 13,14 This technique is represented by the Monte Carlo Simulation block in Fig. 3 and is described in more details in Fig.…”
Section: E Estimation Under Uncertaintymentioning
confidence: 99%
“…where k is Boltzmann's Constant and a, b, X, Y and Z are model fitting parameters and the values are as follows a=78, b=-0.081, X=0.759eV, Y=-66.8eV K and Z=-8.37 e -4 eV/K as given in [5].…”
Section: A Time Dependent Dielectric Breakdown (Tddb)mentioning
confidence: 99%
“…We run Montecarlo simulation for 100000 iterations and calculated the results. Weibull distribution is used to generate the time to failure instances with shape parameter β = 1.64 as in [5] while α i.e. scaling parameter is derived from the equations defined previously at each iteration and MTTF is calculated.…”
Section: B Reliability Analysismentioning
confidence: 99%
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