2022
DOI: 10.1109/ted.2022.3166853
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Modeling Multigate Negative Capacitance Transistors With Self-Heating Effects

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Cited by 4 publications
(1 citation statement)
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“…gate-all-around FETs, Junction-less FETs, etc, and reported an admirable electrostatic performance [2][3][4][5][6]. NC-FinFET appeared as a prominent solution to the short channel effects (SCE); however, they are severely affected by reliability issues like self-heating effect [7,8], random dopant fluctuations (RDF) [9][10][11], work function fluctuations, etc [12,13]. In Fin-FETs, the thin fin width (t FIN ) hinders the substrate doping from altering the threshold voltage (V TH ) in the presence of RDF; thus, insisting on the need for a tunable gate work function [4].…”
Section: Introductionmentioning
confidence: 99%
“…gate-all-around FETs, Junction-less FETs, etc, and reported an admirable electrostatic performance [2][3][4][5][6]. NC-FinFET appeared as a prominent solution to the short channel effects (SCE); however, they are severely affected by reliability issues like self-heating effect [7,8], random dopant fluctuations (RDF) [9][10][11], work function fluctuations, etc [12,13]. In Fin-FETs, the thin fin width (t FIN ) hinders the substrate doping from altering the threshold voltage (V TH ) in the presence of RDF; thus, insisting on the need for a tunable gate work function [4].…”
Section: Introductionmentioning
confidence: 99%